EMArges specializes in dedicated solutions for accurate electromagnetic characterization of materials. Our products are useful in the measurement of dielectric constant and loss tangent of a variety of dielectrics. We also characterize ferromagnets extracting their linewidth and magnetization factor.
Our measurement hardware exploits high Q-factor cavities, such as Fabry-Pérot Open Resonator, dielectric resonators and whispering gallery mode resonators, applicable in the frequency range spanning from 1 GHz up to 130 GHz. The cavities are normally measured with a vector network analyzer, optionally supplemented with frequency extension modules. However, EMArges has also developed a dedicated Q-meter to replace the expensive laboratory-grade instruments without any degradation of the characterization results.
EMArges team will be attending DesignCon in Santa Clara, United States, from January 31th to Feburary 1st (see link to page).
Visit us at Booth #506 for an exclusive look at our products and to meet our expert team. We’re excited to discuss how our technology can benefit your business.
See you there!
EMArges offers a novel type of a Fabry-Perot open resonator with Gaussian mirrors for automated broadband and accurate resonant measurement of electromagnetic properties of low-loss dielectric sheets in the 20-110 GHz frequency range. The system is equipped with a specialized software controlling the measurement process and extracting complex permittivity of the material under test from the measured frequency and Q-factor.
The setup consists of a resonant TE102 cavity operating at ca. 5 GHz with tunable coaxial couplings terminated with SMA connectors. Together with a handheld magnet and a vector network analyzer, the setup enables accurate measurements of the ferromagnetic linewidth (ΔH) of ferrite spheres with the aid of a Windows software delivered with the system. The measurement range of ΔH is wide enough to cover both broad and narrow linewidth samples of arbitrary size, including those for which standard methods based on perturbation theory (IEC 556 1982) do not hold.
We manufacture a new model of Microwave Q-Meter dedicated to the measurement of dielectric properties of low-loss dielectrics with the aid of a Fabry-Perot Open Resonator (FPOR) in the frequency band of 20-40 GHz. The Q-Meter can replace a laboratory-grade vector network analyzer (VNA) that is usually employed to measure the resonant frequency and the quality factor of the FPOR. It allows one to perform automated broadband and precise room temperature scalar measurements of the properties of high-Q resonators loaded with material samples in this frequency range. It is controlled with a specialized software that oversees the measurement process and extracts complex permittivity of the material under test based on the measured properties of the cavity.
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