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Fused silica wafer (148.15 ± 0.36 um) measured 10 times each time removing the sample and inserting again. Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio. Outstanding Dk repeatability of 0.15%!
COP foil (100 ± 1 um) measured 10 times each time removing the sample and inserting again. Dk repeatability of ±0.2% is now mainly driven by the thickness uncertainty of ±1%.
FEP teflon foil (101.7 ± 3.5 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
PVC foil (147.1 ± 4 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
PET foil (147.1 ± 4.5 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
Mylar foil (6 ± 0.5 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
PEEK foil (26 ± 0.5 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
Single-crystal X-cut quartz (494.6 ± 1.5 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
Single-crystal R-cut sapphire (115.4 ± 1.2 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
Sapphire window (1980 ± 1 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
Sapphire window (1017.5 ± 3 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
Sapphire window (267 ± 1.5 um). Dk uncertainty bars are due to thickness uncertainty and Df uncertainty bars are due to signal-to-noise ratio.
